Nova Ltd.

Filed a patent for "malicious source code detection" on Thu, August 3, 2023

Filed a patent for "time doman prism" on Wed, July 12, 2023

Filed a patent for "scanning white light interferometer" on Wed, July 12, 2023

Filed a patent for "full wafer metrology" on Wed, February 8, 2023

Filed a patent for "air tolerant photocathode electron gun" on Fri, March 24, 2023

Filed a patent for "x-ray focusing and wavelength selection" on Sun, March 26, 2023

Filed a patent for "led illumination module" on Tue, April 18, 2023

Filed a patent for "high frequency spectral photoreflectance technique" on Tue, April 18, 2023

Filed a patent for "integrated metrology" on Mon, May 22, 2023

Filed a patent for "eliminating charge accumulation on insulating surface and on semiconductor structures in xps in-line wafer metrology" on Tue, May 23, 2023

Filed a patent for "accurate raman spectroscopy" on Thu, June 27, 2024

Filed a patent for "combined ocd and photoreflectance method and system" on Thu, February 2, 2023

Filed a patent for "optical critical dimensions (ocd) metrology for thick stacks" on Wed, June 29, 2022

Filed a patent for "self-supervised representation learning for interpretation of ocd data" on Thu, January 19, 2023

Filed a patent for "accurate raman spectroscopy" on Thu, February 9, 2023

Filed a patent for "accurate raman spectroscopy" on Thu, June 1, 2023

Filed a patent for "measuring local cd uniformity using scatterometry and machine learning" on Thu, April 27, 2023

Filed a patent for "optical metrology system and method" on Thu, April 20, 2023

Filed a patent for "high brightness primary x-ray source for in-line xps and xrf metrology" on Thu, September 22, 2022

Filed a patent for "machine and deep learning methods for spectra-based metrology and process control" on Thu, April 20, 2023

Filed a patent for "coherent spectroscopy for tsv metrology" on Sun, November 13, 2022

Filed a patent for "optical technique for material characterization" on Thu, September 21, 2023

Filed a patent for "systems and methods for optical metrology" on Thu, September 21, 2023

Filed a patent for "system and method for controlling measurements of sample's parameters" on Thu, June 15, 2023

Filed a patent for "accurate raman spectroscopy" on Thu, January 18, 2024