Back/Nova's ELIPSON® Solution Selected as Key Tool in Semiconductor Manufacturing Advancement
tech·October 9, 2025·nvmi

Nova's ELIPSON® Solution Selected as Key Tool in Semiconductor Manufacturing Advancement

ED
Editorial
Cashu Finance·2 min read
TL;DR
  • Nova's ELIPSON® solution is selected as the Tool of Record for advanced Gate-All-Around manufacturing by a leading foundry.
  • The ELIPSON® platform offers non-destructive, precise material characterization, essential for modern semiconductor fabrication.
  • Nova's commitment to innovation in metrology supports high-volume production and enhances semiconductor manufacturers' efficiency and product quality.

Nova's ELIPSON® Solution Gains Traction in Semiconductor Manufacturing

In a significant development for the semiconductor industry, Nova Ltd. announces that its ELIPSON® materials metrology solution has been selected as the Tool of Record by a leading global foundry for advanced Gate-All-Around (GAA) manufacturing processes. This designation marks a pivotal achievement for the ELIPSON® platform, which specializes in non-destructive, in-die material characterization crucial for the increasingly complex demands of semiconductor fabrication. As the industry shifts towards more advanced device architectures, the ability to perform precise and repeatable measurements at the nanoscale becomes paramount for manufacturers seeking to enhance production efficiency and product quality.

The ELIPSON® solution employs state-of-the-art Raman spectroscopy technology, enabling semiconductor manufacturers to conduct rapid, non-contact material analysis. This capability is vital for maintaining competitive advantage in a market that demands innovation and speed. In response to the foundry's needs, Nova has promptly fulfilled multiple orders for ELIPSON® tools, demonstrating its commitment to supporting high-volume production processes. Gaby Waisman, President and CEO of Nova, highlights that this selection underscores the company's dedication to providing tailored solutions that align with the evolving requirements of its customers, further solidifying the importance of its materials metrology portfolio.

Moreover, the adoption of Nova's Metrion® platform by another GAA customer showcases a broader trend of expanding Nova's metrology solutions across advanced logic node production. By continually delivering high-performance metrology solutions, Nova enhances process control throughout the semiconductor manufacturing lifecycle. This ongoing innovation not only helps customers improve performance but also increases product yields and accelerates time to market, essential factors in an industry characterized by rapid technological advancements.

In addition to the advancements with the ELIPSON® platform, Nova's global operations position it as a key partner to semiconductor manufacturers, facilitating the industry's push for cutting-edge production capabilities. The company is actively involved in shaping the future of semiconductor manufacturing through its advanced metrology solutions, which are designed to meet the challenges posed by next-generation device architectures.

With the recent selection of the ELIPSON® solution, Nova reinforces its role as a leader in materials metrology, ensuring that it remains at the forefront of innovation in the semiconductor sector. This development not only highlights the growing demand for sophisticated metrology tools but also exemplifies Nova's proactive approach in addressing the needs of its customers in an ever-evolving landscape.